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EuMIC: Improved Measurement-Based Extraction Algorithm of a Comprehensive Extrinsic Element Network for Large-Size GaN HEMTs
Proceedings of the 5th European Microwave Integrated Circuits Conference Improved Measurement-Based Extraction Algorithm of a Comprehensive Extrinsic Element Network for Large-Size GaN HEMTs J. Alberto Zamudio-Flores#1, Günter Kompa#2 # FG Mikrowellenelektronik (formerly FG Hochfrequenztechnik (HFT)), University of Kassel, Wilhelmshoeher Allee 73, D34121 Kassel, Germany 1 zamudio@uni-kassel.de
EuMIC: High Power Frequency Multipliers to 330GHz
Proceedings of the 5th European Microwave Integrated Circuits Conference High Power Frequency Multipliers to 330 GHz Byron Alderman1, Manju Henry1, Alain Maestrini2, Jesús Grajal3, Ralph Zimmermann4, Hosh Sanghera1, Hui Wang1, Paul Wilkinson1, and David Matheson1 Rutherford Appleton Laboratory, Chilton, Oxfordshire, OX11 0QX, UK 2 Observatoire de Paris, LERMA, 75014 Paris, France 3 Universidad Po
EuMIC: Single-Waveguide Power-Combined Multipliers for Next Generation LO Sources Above 100GHz
Proceedings of the 5th European Microwave Integrated Circuits Conference Single-Waveguide Power-Combined Multipliers for Next Generation LO Sources Above 100 GHz José V. Siles*1, Alain Maestrini*2, Steven Davies#3, Byron Alderman&4 and Hui Wang&5 * Observatoire de Paris, LERMA, 61 avenue de l'Observatoire, 75014 Paris, France Université Pierre et Marie Curie-Paris 6 {1 jose-vicente.siles, # 2
EuMIC: The Continuous Class-F Mode Power Amplifier
Proceedings of the 5th European Microwave Integrated Circuits Conference The Continuous Class-F Mode Power Amplifier V. Carrubba, A. L. Clarke, M. Akmal, J. Lees, J. Benedikt, P. J. Tasker, S. C. Cripps Cardiff School of Engineering, Cardiff University, Cardiff, CF24 3AA, United Kingdom carrubbav@cardiff.ac.uk Abstract -- This paper presents, for the first time the theoretical introduction and ex
EuMIC: Current Density Dependence of Minimum Noise Figure for Gallium Nitride HEMTs
Proceedings of the 5th European Microwave Integrated Circuits Conference Current Density Dependence of Minimum Noise Figure for Gallium Nitride HEMTs Tyler Ross #1 , Gabriel Cormier #2 , Khelifa Hettak *3 and Rony E. Amaya *4 d'ingénierie, Université de Moncton 57, avenue Antonine-Maillet, Moncton (N.B.) Canada E1A 3E9 1 etr3504@umoncton.ca 2 gabriel.cormier@umoncton.ca # Faculté Research Cent
EuMIC: CMOS Compatible Medium Voltage LDMOS Transistors for Wireless Applications up to 5.8GHz
Proceedings of the 5th European Microwave Integrated Circuits Conference CMOS Compatible Medium Voltage LDMOS Transistors for Wireless Applications up to 5.8 GHz Daniel Gruner1, Roland Sorge2, Olof Bengtsson3, and Georg Boeck1 Microwave Engineering Laboratory, Berlin Institute of Technology Einsteinufer 25, 10587 Berlin, Germany 2 IHP Innovations for High Performance Microelectronics Im Technolog
EuMIC: Compact Front End Modules for WLAN Applications with Integrated Passive Devices Using Selectively Anodized Aluminum Substrate
Proceedings of the 5th European Microwave Integrated Circuits Conference Compact Front End Modules for WLAN Applications with Integrated Passive Devices Using Selectively Anodized Aluminum Substrate Je-In Yu#1, Jong-Min Yook*, Jun-Chul Park+, Cheol-Ho Kim#, Young-Se Kwon#2 # Department of Electrical Engineering, KAIST Yuseong-gu, Daejeon, Republic of Korea 1 jeain_yu@kaist.ac.kr 2 kwon@ee.kaist
EuMIC: Extraction of Parametric Circuit Models from Scattering Parameters of Passive RF Components
Proceedings of the 5th European Microwave Integrated Circuits Conference Extraction of Parametric Circuit Models from Scattering Parameters of Passive RF Components Piero Triverio #1 , Michel Nakhla , Stefano Grivet-Talocia # # Department of Electronics, Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129, Torino, Italy 1 piero.triverio@polito.it Department of Electronics, Carleton Un
EuMIC: Plasmonics for Beam Engineering
Proceedings of the 5th European Microwave Integrated Circuits Conference Plasmonics for Beam Engineering Federico Capasso#1, Nanfang Yu#2 # Harvard School of Engineering and Applied Sciences Harvard University, Cambridge, MA 02138, USA 1 capasso@seas.harvard.edu 2 nyu@fas.harvard.edu Abstract-- This paper reviews our recent work on laser beam shaping using plasmonics. We demonstrated that by i
EuMIC: Trapping Related Degradation Effects in AlGaN/GaN HEMT
Proceedings of the 5th European Microwave Integrated Circuits Conference Trapping Related Degradation Effects in AlGaN/GaN HEMT G. Astre#1, J.G. Tartarin*#2, B. Lambert§3 CNRS; LAAS 7avenue du Colonel Roche, F-31077 Toulouse, France 2 # gastre@laas.fr tartarin@laas.fr 1 Université de Toulouse; UPS; INSA; INP; ISAE F-31077 Toulouse, France § UMS-SAS Route départementale 128, BP 46, 91401 Orsay