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EuMIC: A 484-(mu)m^2 21-GHz LC-VCO Beneath a Stacked-Spiral Inductor
Proceedings of the 5th European Microwave Integrated Circuits Conference A 484-µm2 21-GHz LC-VCO beneath a Stacked-Spiral Inductor Rui Murakami, Kenichi Okada, and Akira Matsuzawa Department of Physical Electronics, Tokyo Institute of Technology 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan Tel & Fax: +81-3-5734-3764 murakami@ssc.pe.titech.ac.jp Abstract-- This paper proposes an ultra
EuMIC: Potentiality of Commercial Metamorphic HEMT at Cryogenic Temperature and Low Voltage Operation
Proceedings of the 5th European Microwave Integrated Circuits Conference Potentiality of Commercial Metamorphic HEMT at Cryogenic Temperature and Low Voltage Operation A.Noudéviwa#, Y.Roelens#1, F.Danneville#, A. Olivier#, N. Wichmann#, N. Waldhoff#, S. Lepilliet#, G.Dambrine#, L. Desplanque#, X. Wallart#, J. Bellaiche*, D. Smith*, H. Maher*2 and S.Bollaert # IEMN, UMR CNRS 8520, Université de Li
EuMIC: BeamFormer ASIC in UHF-L Band for the Square Kilometer Array International Project
Proceedings of the 5th European Microwave Integrated Circuits Conference BeamFormer ASIC in UHF-L band for the Square Kilometer Array international project Stéphane Bosse, Séverin Barth, Steve Torchinsky, Bruno Da Silva Station de radioastronomie de Nançay, Paris Observatory Nançay, France stephane.bosse@obs-nancay.fr Abstract-- An implementation of a beamformer Application Specific Integrated C
EuMIC: A Distributed Upconverter MMIC with Composite Right/Left Handed Transmission Lines
Proceedings of the 5th European Microwave Integrated Circuits Conference A Distributed Upconverter MMIC with Composite Right/Left Handed Transmission Lines Munenari Kawashima#*1, Kenjiro Nishikawa#2, Shigeo Kawasaki§3, Harunobu Seita *4, Yoshiharu Omura #*5 # NTT Network Innovation Laboratories, NTT Corporation 1-1 Hikarinooka, Yokosuka, Kanagawa, 239-0847, Japan 1 kawashima.munenari@lab.ntt.co
EuMIC: Rigorous, HB-Based Nonlinear Stability Analysis of Multi-Device Power Amplifier
Proceedings of the 5th European Microwave Integrated Circuits Conference Rigorous, HB-based nonlinear stability analysis of multi-device power amplifier Federica Cappelluti1 , Fabio L. Traversa2 , Fabrizio Bonani3 , Simona Donati Guerrieri4 , Giovanni Ghione5 1,3,4,5 Dipartimento di Elettronica, Politecnico di Torino Corso Duca degli Abruzzi 24, I-10129 Torino, Italy 1 federica.cappelluti@polit
EuMIC: Development of Enhancement Mode AlGaN/GaN MOS-HEMTs Using Localized Gate-Foot Oxidation
Proceedings of the 5th European Microwave Integrated Circuits Conference Development of Enhancement Mode AlGaN/GaN MOS-HEMTs using Localized Gate-Foot Oxidation Abhishek Banerjee , Sanna Taking , Douglas MacFarlane , Amir Dabiran* and Edward Wasige 1 2 3 High Frequency Electronics Group,Electronics & Electrical Engineering Department, University of Glasgow Glasgow, United Kingdom 1 A.Banerjee@e
EuMIC: New Process for Low Sheet and Ohmic Contact Resistance of AlN/GaN MOS-HEMTs
Proceedings of the 5th European Microwave Integrated Circuits Conference New Process for Low Sheet and Ohmic Contact Resistance of AlN/GaN MOS-HEMTs S. Taking#1, A.Z. Khokhar#, D. MacFarlane#, S. Sharabi#, A.M. Dabiran*2 and E. Wasige#3 # High Frequency Electronics Group, Electronics & Electrical Engineering Department, University of Glasgow Glasgow, United Kingdom 3 sanna@elec.gla.ac.uk e.wasi
EuMIC: Low-Phase-Noise Wide-Frequency-Range Differential Ring-VCO with Non-Integral Subharmonic Locking in 0.18(mu)m CMOS
Proceedings of the 5th European Microwave Integrated Circuits Conference Low-Phase-Noise Wide-Frequency-Range Differential Ring-VCO with Non-Integral Subharmonic Locking in 0.18 µm CMOS Sang yeop Lee #1 , Shuhei Amakawa #2 , Noboru Ishihara #3 , Kazuya Masu #4 Integrated Research Institute, Tokyo Institute of Technology 4259-R2-17 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan lee.s.af@m.titech.a
EuMIC: Printed RF Tags and Sensors: The Confluence of Printing and Semiconductors
Proceedings of the 5th European Microwave Integrated Circuits Conference Printed RF tags and sensors: the confluence of printing and semiconductors Vivek Subramanian, Frank Liao, and Huai-Yuan Tseng EECS Department, University of California, Berkeley Berkeley, CA 94720-1170, USA viveks@eecs.berkeley.edu Abstract-- Printed electronics is considered a promising technology for low-cost electronics d
EuMIC: Development of a Neural Approach for Bias-Dependent Scalable Small-Signal Equivalent Circuit Modeling of GaAs HEMTs
Proceedings of the 5th European Microwave Integrated Circuits Conference Development of a Neural Approach for Bias-Dependent Scalable Small-Signal Equivalent Circuit Modeling of GaAs HEMTs Zlatica Marinkovi #1, Giovanni Crupi*2, Alina Caddemi*3, Vera Markovi#4 # Faculty of Electronic Engineering, University of Nis Aleksandra Medevedeva 14, 18000 Nis, Serbia 1 zlatica.marinkovic@elfak.ni.ac.rs 4