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EuMIC: Characterization and Modelling of 40nm mHEMT Process up to 110GHz
Proceedings of the 11th European Microwave Integrated Circuits Conference Characterization and Modelling of 40 nm mHEMT process up to 110 GHz R. Cleriti, W. Ciccognani, S. Colangeli, E. Limiti Electronic Engineering Department University of Roma Tor Vergata Via del Politecnico 1 Roma, Italy 00133 Email: r.cleriti@ing.uniroma2.it P. Frijlink and M. Renvois´ e OMMIC Cedex Limeil-Brevannes, France
EuMIC: Characterization of a High Power GaN Device for Class E PA Design with Non-Sinusoidal Stimulus
Proceedings of the 11th European Microwave Integrated Circuits Conference Characterization of a high power GaN device for class E PA design with non-sinusoidal stimulus Vittorio Camarchia , Elisa Cipriani , Paolo Colantonio , Marco Pirola , Roberto Quaglia , Lorena Cabria§ , and Natanael Ayllon¶ Politecnico di Torino, Dept. Electronic and Telecommunication, C.so Duca degli Abruzzi 24, 10129 Tor
EuMIC: Hairpin Bandpass Filter with Tunable Center Frequency and Tunable Bandwidth Based on Screen Printed Ferroelectric Varactors
Proceedings of the 11th European Microwave Integrated Circuits Conference Hairpin Bandpass Filter With Tunable Center Frequency and Tunable Bandwidth Based on Screen Printed Ferroelectric Varactors Christian Schuster , Alex Wiens , Martin Schüßler , Christian Kohler , Joachim Binder and Rolf Jakoby Institute for Microwave Engineering and Photonics, Technische Universität Darmstadt, Darmstadt, G
EuMIC: Physics-Based Modeling of FinFET RF Variability
Proceedings of the 11th European Microwave Integrated Circuits Conference Physics-based modeling of FinFET RF variability A. M. Bughio1 , S. Donati Guerrieri1 , F. Bonani1 , G. Ghione1 1 Dipartimento di Elettronica e Telecomunicazioni, Politecnico di Torino Corso Duca degli Abruzzi, 24, I-10129 Torino, ITALY Abstract--This paper presents the physics-based variability analysis of multi-fin doubl
EuMIC: Highly Linear Fully Integrated Class-O Power Amplifier in Standard 65nm CMOS Technology
Proceedings of the 11th European Microwave Integrated Circuits Conference Highly Linear Fully Integrated Class-O Power Amplifier in Standard 65 nm CMOS Technology Muh-Dey Wei and Renato Negra Chair of High Frequency Electronics RWTH Aachen University, 52062 Aachen, Germany mulder@ieee.org, negra@ieee.org Abstract--This paper demonstrates a fully integrated class-O power amplifier (PA), as a stan
EuMIC: Results from a Prototype 6GSPS Digital to Analogue Converter with Greater Than 7GHz Analogue Bandwidth
Proceedings of the 11th European Microwave Integrated Circuits Conference Results from a Prototype 6GSps Digital to Analogue Converter with greater than 7 GHz Analogue Bandwidth. A. Glascott-Jones, M. Wingender, F. Bore, M.Stackler, N. Chantier, K. Salmi, P. Coquille, M. Martin, V. Monier, G. Wagner, E. Savasta, D. Bellin, R. Pilard, J Duvernay Broadband Data Converters e2v St. Egreve, France and
EuMIC: A Q-Band Power Amplifier MMIC Using 100nm AlGaN/GaN HEMT
Proceedings of the 11th European Microwave Integrated Circuits Conference A Q-Band Power Amplifier MMIC Using 100 nm AlGaN/GaN HEMT Philip Feuersch¨ tz , Christian Friesicke , R¨ diger Quay , and Arne F. Jacob u u Technische Fraunhofer Universit¨ t Hamburg-Harburg, Denickestr. 22, 21073 Hamburg a Institute for Applied Solid-State Physics IAF, Tullastr. 72, 79108 Freiburg philip.feuerschuetz@tu
EuMIC: A 2.6-GHz-Band 78-W Doherty Power Amplifier with GaN HEMT Unit-Cell Structure Robust for Layout-Dependent Loop Oscillation
Proceedings of the 11th European Microwave Integrated Circuits Conference A 2.6-GHz-Band 78-W Doherty Power Amplifier with GaN HEMT Unit-Cell Structure Robust for Layout-Dependent Loop Oscillation Shohei Imai*1, Shinsuke Watanabe*, Yuji Komatsuzaki#, Hiroyuki Okazaki*, Shintaro Shinjo#, Koji Yamanaka#, Yoshinobu Sasaki*, Hideaki Katayama*,Akira Inoue* *High Frequency and Optical Device works, Mit
EuMIC: Novel Approach to Trapping Effect Modeling Based on Chalmers Model and Pulsed S-Parameter Measurements
Proceedings of the 11th European Microwave Integrated Circuits Conference Novel Approach to Trapping Effect Modeling Based on Chalmers Model and Pulsed S-Parameter Measurements Peng Luo , Olof Bengtsson and Matthias Rudolph Leibniz-Institut f¨ r H¨ chstfrequenztechnik (FBH), Germany u o Email: Peng Luo@fbh-berlin.de Brandenburg University of Technology Ulrich L. Rohde Chair of RF and Microwave T
EuMIC: Common-Denominator Modelling for Stability Analysis of Electronic Circuits
Proceedings of the 11th European Microwave Integrated Circuits Conference Common-Denominator Modelling for Stability Analysis of Electronic Circuits Adam Cooman, Francesco Ferranti, Yves Rolain, Gerd Vandersteen Vrije Universiteit Brussel (VUB) Department of Fundamental Electricity and Instrumentation Brussels, Belgium {acooman,francesco.ferranti,yves.rolain,gerd.vandersteen}@vub.ac.be Ebrahim L