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EuMC: A Low-Loss Compact Stripline Low-Pass Filter for Millimeter-Wave Applications
Proceedings of the 46th European Microwave Conference A Low-Loss Compact Stripline Low-Pass Filter for Millimeter-Wave Applications 1 A. Gomez-Torrent 1 , I. Arregui 1 , J.D. Martinez 2 , F. Teberio 1 , J.V.M. Sanchez de Rojas 3 , V.E. Boria 3 , M.A.G. Laso 1 Electrical and Electronic Engineering Department, Public University of Navarra, 31006 Pamplona, Spain 2 I3M, Universitat Polit` cnica de V
EuMC: Evanescent-Mode Cavity-Based Frequency Synthesizer
Proceedings of the 46th European Microwave Conference Evanescent-Mode Cavity-Based Frequency Synthesizer Yu-Chen Wu, Mohammad Abu Khater, and Dimitrios Peroulis School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907, USA. Email: ycwu@purdue.edu, mabukhat@purdue.edu, dperouli@purdue.edu Abstract--In this paper, an evanescent-mode (EVA) cavitybased frequency synt
EuMC: Polynomial Model for High-Order and Multi-Carrier Passive Intermodulation Products
Proceedings of the 46th European Microwave Conference Polynomial Model for High-Order and Multi-Carrier Passive Intermodulation Products Dmitry S. Kozlov, Alexey P. Shitvov and Alexander G. Schuchinsky Institute of Electronics, Communications and Information Technology (ECIT) Queen's University Belfast Queen's Road, Queen's Island, Belfast BT3 9DT, UK d.kozlov@qub.ac.uk, a.shitvov@qub.ac.uk, a.g.
EuMC: High Performance Resonant Tunneling Diode Oscillators as Terahertz Sources
Proceedings of the 46th European Microwave Conference High Performance Resonant Tunneling Diode Oscillators as Terahertz Sources Jue Wang, Abdullah Al-Khalidi, Khalid Alharbi, Afesomeh Ofiare, Haiping Zhou, and Edward Wasige High Frequency Electronics Group, School of Engineering University of Glasgow, Glasgow, United Kingdom Jue.Wang@glasgow.ac.uk José Figueiredo Departamento de Física da Facul
EuMC: Low-Cost, High-Resolution Printing of Planar Microwave Structures for Rapid Design Iterations
Proceedings of the 46th European Microwave Conference Low-Cost, High-Resolution Printing of Planar Microwave Structures for Rapid Design Iterations Tyler Nuanes1, Brian Dieckman2, Tony New2, Benjamin S. Cook3, and Edward Wheeler1* 1 Electrical and Computer Eng., Rose-Hulman Institute of Technology, Terre Haute, IN 47803, USA 2 Sony DADC, Terre Haute, IN 47804, USA 3 Texas Instruments Kilby Labs,
EuMC: Ultra Broadband Planar Transmission Line Transformers with Ferrite Based Bandwidth Extension
Proceedings of the 46th European Microwave Conference Ultra Broadband Planar Transmission Line Transformers with Ferrite Based Bandwidth Extension 2 Microwave Engineering Laboratory, Berlin Institute of Technology, 10587, Berlin, Germany Ferdinand-Braun-Institut, Leibniz-Institut fuer Hoechstfrequenztechnik, 12489, Berlin, Germany z.zhang@tu-berlin.de 1 Zihui Zhang1 , Georg Boeck1,2 Abstract-
EuMC: Cross Dipoles Rectenna for Microwave Applications
Proceedings of the 46th European Microwave Conference Cross Dipoles Rectenna for Microwave Applications A. Okba1, S. Charlot1, P-F Calmon1, A. Takacs 1,2, H. Aubert 1,3 1 CNRS, LAAS, 7 avenue du colonel Roche, F-31400, Toulouse, France 2 Univ de Toulouse, UPS, LAAS, F-31400, Toulouse, France 3 Univ de Toulouse, INP, LAAS, F-31400, Toulouse, France Abstract--This paper addresses recent results o
EuMC: Broadband Millimeter Wave Cavity Backed Patch Antenna Sub-Array Using Advanced Multi-Layer PCB Technology
Proceedings of the 46th European Microwave Conference Broadband Millimeter Wave Cavity Backed Patch Antenna Sub-array Using Advanced Multi-Layer PCB Technology M. Mosalanejad1,2 , S. Brebels1 , I. Ocket1,2 , C. Soens1 , G. A. E. Vandenbosch2 2 KU SSET/CSI, Kapeldreef 75, B-3001 Leuven, Belgium Leuven, Div. ESAT-TELEMIC, Kasteelpark Arenberg 10, B-3001, Leuven, Belgium mohammad.mosalanejad@imec.b
EuMC: Multi-Probe Near-Field Measurement of Stochastic Noisy Radiations: Perspectives for Chip-Package LNA-Probe Co-Design
Proceedings of the 46th European Microwave Conference Multi-Probe Near-Field Measurement of Stochastic Noisy Radiations: Perspectives for Chip-Package LNA-Probe Co-Design Sidina Wane1, Damienne Bajon2, Dominique Lesénéchal1, Johannes A. Russer3, David Thomas4, and Peter Russer3 NXP-Semiconductors, Caen-France 2 ISAE-Université de Toulouse 3 Institute for Nanoelectronics, Technische Universität Mü
EuMC: Near-Field Measurement of Connected Smart RFIC Objects Accounting for Environmental Uncertainties
Proceedings of the 46th European Microwave Conference Near-Field Measurement of Connected Smart RFIC Objects accounting for Environmental Uncertainties Sidina Wane1, Damienne Bajon2, Dominique Lesénéchal1, Johannes Russer3, Peter Russer3, David Thomas4, Gregor Tanner4, Gabriele Gradoni4, and Yury Kuznetsov5 NXP-Semiconductors, Caen-France ISAE-Université de Toulouse-France 3 Institute for Nanoele