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EuMIC: Study of Thick Copper Metallization with WNx as Diffusion Barrier for AlGaN/GaN HEMTs
Proceedings of the 14th European Microwave Integrated Circuits Conference Study of Thick Copper Metallization with WNx as Diffusion Barrier for AlGaN/GaN HEMTs Y. C. Lin1, M. W. Lee2, M. Y. Tsai3, C. Wang1, J. N. Yao4, T. J. Huang2, H. T. Hsu2, J. S. Maa3, and Edward Y. Chang124* 1 2 Department of Materials Science and Engineering, National Chiao Tung University, Taiwan International College of
EuMIC: Experimental Analysis of In-Package Harmonic Manipulations with a 160W GaN HEMT Power Bar
Proceedings of the 14th European Microwave Integrated Circuits Conference Experimental Analysis of In-package Harmonic Manipulations with a 160 W GaN HEMT Power Bar Osman Ceylan1 , Ali I. Isik2 , Yi Zhu3 Sergio Pires4 Ampleon BV, The Netherlands {1 osman.ceylan, 2 ali.isik, 3 yi.zhu, 4 sergio.pires}@ampleon.com of an integrated 2nd harmonic termination at the gate with 120 W output power at S-Ba
EuMIC: A 2--38GHz Linear GaAs pHEMT TIA for a Quasi-Coherent Optical Receiver
Proceedings of the 14th European Microwave Integrated Circuits Conference A 2-38 GHz Linear GaAs pHEMT TIA for a Quasi-Coherent Optical Receiver Guillermo Silva Valdecasa#*1 , Jesper Bevensee Jensen* , Morten Didriksen+ , Tom K. Johansen# # Department of Electrical Engineering, Technical University of Denmark * Bifrost Communications Aps., Denmark + NIMODI Engineering, Denmark 1 gsival@elektro.d
EuMIC: Effective Resistivity Extraction of Low-Loss Silicon Substrate at Millimeter-Wave Frequencies
Proceedings of the 14th European Microwave Integrated Circuits Conference Effective Resistivity Extraction of Low-Loss Silicon Substrate at Millimeter-Wave Frequencies Lucas Nyssens#1, Martin Rack#2, Jean-Pierre Raskin#3 # Department of electrical engineering ELEN, Université catholique de Louvain, Belgium {1lucas.nyssens, 2martin.rack, 3jean-pierre.raskin}@uclouvain.be inductors [3], the harmo
EuMIC: A Digital Adjustable Fully Integrated Bistatic Interferometric Radar Transceiver at 60GHz in a 130nm BiCMOS Technology
Proceedings of the 14th European Microwave Integrated Circuits Conference A Digital Adjustable Fully Integrated Bistatic Interferometric Radar Transceiver at 60 GHz in a 130 nm BiCMOS Technology M. Voelkel#1 , M. Dietz# , A. Hagelauer# , E. M. Hussein* , D. Kissinger*+ , and R. Weigel# # Institute for Electronics Engineering, FAU Erlangen-N¨urnberg, Cauerstr. 9, 91058 Erlangen, Germany * IHP, Im
EuMIC: An Integrated mm-Wave Quadrature Up-Conversion Mixer Based on a Six-Port Modulator
Proceedings of the 14th European Microwave Integrated Circuits Conference An Integrated mm-Wave Quadrature Up-Conversion Mixer Based on a Six-Port Modulator Vincent Rieß, Paul St¨arke, Corrado Carta and Frank Ellinger Chair for Circuit Design and Network Theory Technische Universit¨at Dresden , 01062 Dresden, Germany vincent.riess@tu-dresden.de PRF Abstract — A quadrature up-conversion mixer for
EuMIC: 4096-QAM Microwave Transmitter Providing Efficiency Exceeding 50% and EVM Below 1%
Proceedings of the 14th European Microwave Integrated Circuits Conference 4096-QAM Microwave Transmitter Providing Efficiency Exceeding 50% and EVM Below 1% E. McCune, Q. Diduck Eridan Communications, Santa Clara, CA, 95050, USA Abstract — While users of spectrum pay large sums of money for spectrum access, they do not sell spectrum to their customers but rather they market data rates. Developin
EuMIC: A 115--185GHz 75--115mW High-Gain PA MMIC in 250-nm InP HBT
Proceedings of the 14th European Microwave Integrated Circuits Conference A 115-185 GHz 75-115 mW High-Gain PA MMIC in 250-nm InP HBT Zach Griffith, Miguel Urteaga, and Petra Rowell Teledyne Scientific Company, 1049 Camino Dos Rios, Thousand Oaks, CA 91360, USA zach.griffith@teledyne.com VC DC bus IC amp … … Series TL tune R base-ballast Q1 Shunt TL tune RF IN RF OUT Series TL tune RF gro
EuMIC: Systematic Experimental f_(T) and f_(max) Comparison of 40-nm Bulk CMOS versus 45-nm SOI Technology
Proceedings of the 14th European Microwave Integrated Circuits Conference Systematic Experimental fT and fmax Comparison of 40-nm Bulk CMOS versus 45-nm SOI Technology J. Rimmelspacher1,2, A. Werthof2, R. Weigel1, V. Issakov2 1 Friedrich-Alexander University Erlangen-Nuremberg (FAU), Cauerstrasse 9, 91058 Erlangen, Germany 2 Infineon Technologies AG, Am Campeon 1-15, 85579 Neubiberg, Germany Ab
EuMIC: Comparative Noise Investigation of High-Performance GaAs and GaN Millimeter-Wave Monolithic Technologies
Proceedings of the 14th European Microwave Integrated Circuits Conference Comparative noise investigation of high-performance GaAs and GaN millimeter-wave monolithic technologies W. Ciccognani# , S. Colangeli#1 , A. Serino# , L. Pace# , S. Fenu# , P. E. Longhi# , E. Limiti# , J. Poulain* , R. Leblanc* # Dept. of Electronics Engineering, University of Roma Tor Vergata, Italy SAS, 2 rue du Moulin,