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Alleviating the Adverse Effects of Residual Stress in RF MEMS Switches
Alleviating the Adverse Effects of Residual Stress in RF MEMS Switches Dimitrios Peroulis, Sergio P. Pacheco, Kamal Sarabandi, and Linda P. B. Katehi, Radiation Laboratory, Electrical Engineering and Computer Science Department, University of Michigan, 1301 Beal Ave., Ann Arbor, MI 48109-2122, dperouli@engin.umich.edu, katehi@engin.umich.edu. Abstract -- This paper presents two methods for counter
High Power Ultra Compact VCO with Active Reactance Concepts at 24 GHz
High Power Ultra Compact VCO with Active Reactance Concepts at 24 GHz E. Sönmez, A. Trasser, K. -B. Schad, P. Abele and H. Schumacher Dept. of Electron Devices and Circuits, University of Ulm, D-89069 Ulm, Germany esoenmez@ebs.e-technik.uni-ulm.de Extremely compact layout and circuit design techniques have been applied to commercially available Si/SiGe hetero bipolar transistor (HBT) MMIC technolo
Novel Sub-Harmonic Injection-Locked Balanced Oscillator
Novel Sub-Harmonic Injection-Locked Balanced Oscillator N. Siripon1 , M. Chongcheawchamnan, and I. D. Robertson Microwave and Systems Research Group (MSRG), School of Electronics, Computing and Mathematics, University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom. 1 eep1ns@ee.surrey.ac.uk Abstract -- A novel sub-harmonic injection-locked balanced oscillator is proposed. The circuit provi
Optically-Switched Microwave Filter with the use of Photovaractors in Self-Bias Mode
OPTICALLY-SWITCHED MICROWAVE FILTER WITH THE USE OF PHOTOVARACTORS IN SELF-BIAS MODE Zenon R. Szczepaniak*, Bogdan A. Galwas& and Sergei A. Malyshev# *& Institute of Microelectronics and Optoelectronics, Warsaw University of Technology Nowowiejska 15/19, 00-665 Warsaw, Poland Phone/Fax: (+48 22) 825 03 93 * zenon.szczepaniak@elka.pw.edu.pl , & B.Galwas@elka.pw.edu.pl # Institute of Electronics, N
Thick Metal Plate Insertion Make FR4 Multilayer Board a Simple Carrier for RF Power Circuits
Thick metal plate insertion make FR4 multilayer board a simple carrier for RF power circuits Carlo Buoli , Giovanni Biffi, Tommaso Turillo, Alessandro Zingirian Siemens Information and Communication Networks S.p.A., Strada Padana Superiore Km158 20060, Cassina de Pecchi - MILANO. e-mail: Carlo.Buoli@icn.siemens.it, Giovanni_Ivano.Biffi@icn.siemens.it, Tommaso.Turillo@icn.siemens.it, Alessandro.Zi
Line Capacitance and Impedance of Coplanar-Strip Waveguides on Substrates with Multiple Dielectric Layers
LINE CAPACITANCE AND IMPEDANCE OF COPLANAR-STRIP WAVEGUIDES ON SUBSTRATES WITH MULTIPLE DIELECTRIC LAYERS 1 S. Gevorgian 1,2 and H. Berg1 Department of Microelectronics, Chalmers University of Technology, Gothenburg, Sweden 2 Ericsson Microwave Systems, Moelndal, Sweden email: spartak@ep.chalmers.se ABSTRACT Closed form formulas for the basic parameters of Coplanar-Strip line on a finite thickne
Measurement and Modelling of MIC Components Using Conductive Lithographic Films
Measurement and Modelling of MIC Components Using Conductive Lithographic Films P. R. Shepherd *, & C. Taylor *, P. S. A. Evans l, & D. J. Harrison l *Dept. Electronic & Elec. Eng., University of Bath, Claverton Down, Bath, BA2 7AY, U.K. Email: P.R.Shepherd@bath.ac.uk l Dept. of Design, Brunel University, Englefield Green, Egham, TW20 0JZ, U.K. Email: Peter.Evans@brunel.ac.uk July 11, 2001 AB
Reliability and Performances of Finite Element CAD Tools for the Solution of Microwave Problems
RELIABILITY AND PERFORMANCES OF FINITE ELEMENT CAD TOOLS FOR THE SOLUTION OF MICROWAVE PROBLEMS P. Fernandes *, M. Raffetto * Istituto per la Matematica Applicata del Consiglio Nazionale delle Ricerche, Via De Marini 6, I-16149 Genoa, Italy, fernandes@ima.ge.cnr.it DIBE, University of Genoa, Via Opera Pia 11a, I16145, Genoa, Italy, raffetto@dibe.unige.it ABSTRACT The target of this paper is tw
The Choice of Cell Size and the use of Pre-Calculated Correction Factors in the Analysis of Planar Circuits using FDTD and TLM
THE CHOICE OF CELL SIZE AND THE USE OF PRE-CALCULATED CORRECTION FACTORS IN THE ANALYSIS OF PLANAR CIRCUITS USING FDTD AND TLM. Chris J Railton Centre for Communications Research, Faculty of Engineering University of Bristol, Bristol, England, BS8 1BU Phone: (0)117 9545175 Fax: (0)117 9545206 Email chris.railton@bristol.ac.uk ABSTRACT In this contribution it is shown that small changes to the ch
An Investigation of the Proximity Effect of Millimeter-Wave MMICs in Flip-Chip Configuration
An Investigation of the Proximity Effect of Millimeter-Wave MMICs in Flip-Chip Configuration Oliver Nagy1, Patric Heide2, Andreas Springer3, Robert Weigel3 Siemens AG, Corporate Technology, D-81730 Munich, Germany, email: oliver.nagy@ieee.org, Phone: ++ 49 89 636 48230, Fax: ++ 49 89 636 46881 2 3 1 EPCOS AG, D-81617 Munich, Germany University of Linz, A-4040 Linz, Austria Abstract ¾ A compariso