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EuMC: Composite Tunable Materials with Low Loss-Factor at Microwaves
Composite Tunable Materials With Low Loss-Factor At Microwaves A.K. Tagantsev , V.O. Sherman Ceramics Laboratory, EPFL Swiss Federal Institute of Technology, Lausanne, Switzerland, alexander.tagantsev@epfl.ch Abstract-- This paper addresses the theory the tunable behavior of the nonlinear dielectric composites, consisting of an electrically tunable ferroelectric material mixed with a linear, low d
EuMC: Electronically Controlled Phase Shifters Based on Right/Left-Handed Transmission Lines
Electronically Controlled Phase Shifters Based on Right/Left-Handed Transmission Lines O.G. Vendik1, I.B. Vendik2, D.V. Kholodnyak2, S.P. Zubko1, and E.V. Serebryakova2 1 St. Petersburg Electrotechnical University, Department of Electronics, 5, Prof. Popov st., 197376, St. Petersburg, Russia, Phone: +7 (812) 346-08-67 2 St. Petersburg Electrotechnical University, Department of Microelectronics
EuMC: Tunable Split Rings Resonators for Reconfigurable Metamaterial Transmission Lines
Tunable Split Rings Resonators for Reconfigurable Metamaterial Transmission Lines I. Gil1, J. Bonache1, J. García-García1 , F. Martín1 and R. Marqués2 1 Departament d'Enginyeria Electrònica. Universitat Autònoma de Barcelona. 08193 BELLATERRA (Barcelona). Spain. Phone: 34935813522; Fax: 34935812600. E-mail: Ferran.Martin@uab.es 2 Departamento de Electrónica y Electromagnetismo. Universidad de Se
EuMC: Spin Wave Processes in Ferrite-Film Structures: Physics and Devices for Microwave Signal Processing
Spin Wave Processes in Ferrite-film Structures: Physics and Devices for Microwave Signal Processing B. A. Kalinikos and A. B. Ustinov St.Petersburg Electrotechnical University, Department of Physical Electronics and Technology, 5 Prof. Popov str., 197376, St.Petersburg, Russia, Tel./FAX: +7 (812) 234 99 83, E-mail: borisk@borisk.usr.etu.spb.ru Abstract -- Physics of spin wave processes in thin fer
EuMC: THz Active Devices and Applications: A Survey of Recent Researches
THz Active Devices and Applications: a Survey of Recent Researches L. Chusseau1 , J.-F. Lampin2 , S. Bollaert2 , L. Duvillaret3 , J. Mangeney4 1 CEM2, UMR5507 CNRS, Université Montpellier II, 34095 Montpellier, FRANCE, chusseau@univ-montp2.fr 2 IEMN UMR8520 CNRS, Cité Scientifique, Avenue Poincaré, BP 60069, 59652 Villeneuve d'Ascq, FRANCE 3 LAHC, Université de Savoie, Campus Scientifique, 73376
EuMC: Stress-Induced Failure Modes in High-Tuning Range RF MEMS Varactors
Stress-Induced Failure Modes in High-Tuning Range RF MEMS Varactors Trushal Chokshi and Dimitrios Peroulis School of Electrical and Computer Engineering, and Birck Nanotechnology Center Purdue University, West Lafayette, USA tchokshi@purdue.edu, dperouli@purdue.edu Abstract-- In this paper we focus on electromechanical modeling of high-tuning range MEMS varactors with a focus on failures caused by
EuMC: New Filter Type Suitable for Miniature Printed Bandpass Filters at RF & Microwave Frequencies
New Filter Type Suitable for Miniature Printed Bandpass Filters at RF & Microwave Frequencies Sinisa Jovanovi, Aleksandar Nesi IMTEL Institute, Blvd Mihaila Pupina 165B, 11070 Belgrade, Serbia and Montenegro Phone: +381 64 823 6513, Fax: +381 11 311 5884, E-mail: siki@insimtel.com Abstract -- The paper presents a new concept of bandpass filters with capacitive coupled resonators applied for reali
EuMC: Schottky Diode-Based Mixers Design and Optimization at Millimetre and Submillimetre-Wave Bands
Schottky Diode-Based Mixers Design and Optimization at Millimetre and Submillimetre-wave Bands J.V. Siles1 , J. Grajal1 , V. Krozer2 , and B. Leone3 1 Universidad Polit´ cnica de Madrid, Departamento de Se~ ales, Sistemas y Radiocomunicaciones, e n E.T.S.I. Telecomunicaci´ n, Ciudad Universitaria S/N, 28040 Madrid, Spain o Phone: +34 91.336.73.58, E-mail: {jovi,jesus}@gmr.ssr.upm.es 2 Orsted-DTU
EuMC: An Integrated Double Balanced Mixer on Multilayer Liquid Crystalline Polymer (M-LCP) Based Substrate
An Integrated Double Balanced Mixer on Multilayer Liquid Crystalline Polymer (M-LCP) Based Substrate Wansuk Yun1, Vinu Govind1 , Sidharth Dalmia2, Venky Sundaram1, Madhavan Swaminathan1, and George E. White2 1 Georgia Institute of Technology, Electrical and Computer Engineering, Atlanta, GA 30332, U.S.A, 404-385-6417 2 Jacket Micro Devices, Suite 213, 75 5th Street, Altanta, GA 30308, USA, 404-52
EuMC: DC -- 65 GHz Characterization of Nanocrystalline Diamond Leaky Film for Reliable RF MEMS Switches
DC 65 GHz Characterization of Nanocrystalline Diamond Leaky Film for Reliable RF MEMS Switches 1 School Joolien Chee1,3 , Ratnakar Karru1,3 , Timothy S. Fisher2,3 , and Dimitrios Peroulis1,3 of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907, USA 2 School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907, USA 3 Birck Nanotechnology Center, P