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EuMIC: A 20 Watt Micro-Strip X-Band AlGaN/GaN HPA MMIC for Advanced Radar Applications
Proceedings of the 3rd European Microwave Integrated Circuits Conference A 20 Watt Micro-strip X-Band AlGaN/GaN HPA MMIC for Advanced Radar Applications C. Costrini1, M. Calori1, A. Cetronio 1, C. Lanzieri 1, S. Lavanga 1, M. Peroni 1, E. Limiti2, A. Serino2, G. Ghione3, G. Melone4 2 SELEX Sistemi Integrati S.p.A., Via Tiburtina Km. 12,400, 00131 Rome, Italy Dipartimento di Ingegneria Elettronic
EuMIC: Low-Cost S-Band Multi-Function MMIC
Proceedings of the 3rd European Microwave Integrated Circuits Conference Low-cost S-band Multi-function MMIC A.P. de Hek, M. Rodenburg and F.E. van Vliet TNO Defence, Security and Safety Oude Waalsdorperweg 63, 2509 JG The Hague, The Netherlands peter.dehek@tno.nl marien.rodenburg@tno.nl frank.vanvliet@tno.nl Abstract-- This paper discusses the design and performance of a four port S-band multi-f
EuMIC: High Power Microstrip GaN-HEMT Switches for Microwave Applications
Proceedings of the 3rd European Microwave Integrated Circuits Conference High Power Microstrip GaN-HEMT Switches for Microwave Applications V. Alleva#1, A. Bettidi#2, A. Cetronio#2, W. Ciccognani*3, M. De Dominicis#1, M. Ferrari*3, E. Giovine*4, C. Lanzieri#2, E. Limiti*3, A. Megna#1, M. Peroni#2, P. Romanini#2 #2 Elettronica SpA, Rome 00131, Italy SELEX Sistemi Integrati SpA, Rome 00131, Italy
EuMIC: 24 GHz LTCC Amplifier Using Packaged HEMTs
Proceedings of the 3rd European Microwave Integrated Circuits Conference 24 GHz LTCC Amplifier Using Packaged HEMTs Veljko Napijalo #1, Vicentiu Cojocaru #2, Takeshi Yokoyama *3 TDK Electronics Ireland 3022 Lake Drive, City West Business Campus, Dublin 24, Ireland 1 2 # Napijalo@tdk.de Cojocaru@tdk.de * TDK Corporation 2-15-7, Higashi-Ohwada, Ichikawa-shi, Chiba, 272-8558, Japan 3 tayoko@mb1.
EuMIC: Millimetre-Wave Hot-Via Interconnect-Based GaAs Chip-Set for Automotive RADAR and Security Sensors
Proceedings of the 3rd European Microwave Integrated Circuits Conference Millimetre-wave Hot-Via interconnect-based GaAs chip-set for automotive RADAR and security sensors PF. Alléaume#1, C. Toussain#,*, C. Auvinet#, D. Domnesque#, P. Quentin#, M. Camiade# # United Monolithic Semiconductors, route départementale 128 BP46, 91401 Orsay Cedex, France 1 pierre-franck.alleaume@ums-gaas.com * XLI
EuMIC: A Triple Tuned Ultra-Wideband VCO in X-K Band
Proceedings of the 3rd European Microwave Integrated Circuits Conference A Triple Tuned Ultra-Wideband VCO in X-K Band Masaomi Tsuru, Kenji Kawakami, Ken'ichi Tajima, Kazuhiro Miyamoto, Masafumi Nakane, Morishige Hieda, Moriyasu Miyazaki Mitsubishi Electric Corporation, 5-1-1 Ofuna, Kamakura, Kanagawa, 247-8501, JAPAN Tsuru.Masaomi@eb.MitsubishiElectric.co.jp Abstract-- We have already proposed a
EuMIC: A 70GHz VCO with 8GHz Tuning Range in 0.13(mu)m CMOS Technology
Proceedings of the 3rd European Microwave Integrated Circuits Conference A 70GHz VCO with 8GHz Tuning Range in 0.13um CMOS Technology Zongru Liu, Efstratios Skafidas and Rob Evans National ICT Australia, Department of Electrical and Electronic Engineering University of Melbourne, Parkville Victoria 3010, Australia 2 z.liu@ee.unimelb.edu stan.skafidas@nicta.com.au 3 rob.evans@nicta.com.au 1 Abs
EuMIC: Millimeter-Wave Low Spurious Quadruple Harmonic Image Rejection Mixer with 90-Degree LO Power Divider
Proceedings of the 3rd European Microwave Integrated Circuits Conference Millimeter-Wave Low Spurious Quadruple Harmonic Image Rejection Mixer with 90-degree LO Power Divider Kenji Kawakami, Kazuhiro Nishida, Morishige Hieda, and Moriyasu Miyazaki Mitsubishi Electric Corporation Ofuna 511, Kamakurashi, Kanagawa, 2478501 Japan Kawakami.Kenji@dc.MitsubishiElectric.co.jp Fig. 1. The block diag
EuMIC: Decrease in Slow Current Transients and Current Collapse in GaN-Based FETs with a Filed Plate
Proceedings of the 3rd European Microwave Integrated Circuits Conference Decrease in Slow Current Transients and Current Collapse in GaN-based FETs with a Filed Plate A. Nakajima, K. Itagaki and K. Horio Faculty of Systems Engineering, Shibaura Institute of Technology 307 Fukasaku, Minuma-ku, Saitama 337-8570, Japan horio@sic.shibaura-it.ac.jp Abstract--Two-dimensional transient analyses of AlGaN
EuMIC: Gate Width Dependence of Noise Parameters and Scalable Noise Model for HEMTs
Proceedings of the 3rd European Microwave Integrated Circuits Conference Gate Width Dependence of Noise Parameters and Scalable Noise Model for HEMTs Yu Zhu, Cejun Wei, Oleksiy Klimashov, Binghui Li, Cindy Zhang, and Yevgeniy Tkachenko Skyworks Solution Inc. 20 Sylvan Road, Woburn, MA 01801, USA yu.zhu@skyworksinc.com Abstract-- Explicit expressions describing the gate width dependences of HEMTs